The HX80N series semi-automatic probe station is a customised comprehensive wafer probe station for sensor wafer testing with excellent test accuracy and can be paired with a customised instrumentation system to complete testing of sensors such as photoelectric sensors, pressure sensors and gas sensors.

Software function introduction
- Can test discs, test range is optional, support for interlaced sampling and ring test MAP chart can be edited test;
- Support bad point retest;
- With offline punching point, synchronous punching point function;
- With contact buffer function, needle mark stability;
- Running accuracy compensation function, to ensure the stability of the test;
- Test yield, total number, speed display;
- CCD image automatic alignment and positioning;
- The equipment has a certain anti-interference ability, supports high and low temperature testing, stable operation;
- Multi-BIN classification test, test data can be stored, can be exported, compatible with the use of back-channel equipment format, with data statistical analysis function;
- Operators, administrators, system manufacturers rights management functions