Low temperature probe stations play a crucial role in scientific research and technological development. It can perform various non-destructive physical and electrical performance tests on samples at low temperatures, helping researchers gain a deeper understanding of the various physical and electrical properties of materials or devices, and providing important data support for the development and application of new materials.
    The PSM-EM low-temperature probe station is a closed-loop horizontal magnetic field electromagnetic probe station that enhances the performance of the standard probe station by adding a+0.6T horizontal electromagnetic field. It can provide a 4.5K-350K high and low temperature vacuum testing environment for electrical parameter testing of semiconductor chips. It can perform all standard I, CV, microwave and optoelectronic experiments and horizontal electromagnetic field measurements. Researchers can use it to perform magnetic transport measurements. PSM-EM is a high-quality probe station for vector magnetic transport measurements in low-temperature probe stations, which can achieve both large magnetic fields of samples and non-destructive electrical testing of chips, wafers and devices in low-temperature vacuum environments.